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Magazine Name : Ieee Transactions On Electron Devices

Year : 2003 Volume number : 50 Issue: 04

A Spice Model For Thin-Film Transistors Fabricated On Grain-Enhanced Polysilicon Film (Article)
Subject: Bsim And Spice , Gbs , Milc
Author: Singh Jagar     
page:      1103 - 1108
1.5-Nm Gate Oxide Cmos On (110) Surface-Oriented Si Substrate (Article)
Subject: 1/F Noise , Cmos , Cutoff Frequency
Author: Hisayo Sasaki Momose     
page:      1001 - 1008
Erratic Erase In Flash Memories-Part I: Basic Experimental Statistical Characterization (Article)
Subject: Erasing Operation , Flash Memories
Author: Andrea Chimenton     
page:      1009 - 1014
Performance Projections Of Scaled Cmos Devices And Circuits With Strained Si-On-Sige Channels (Article)
Subject: Poly-Siga Gate , Scaled Cmos
Author: Jerry G Fossum     
page:      1012 - 1049
Erratic Erase In Flash Memories- Part Ii: Dependence On Operating Conditions (Article)
Subject: Erasing Operation , Flash Memories
Author: Andrea Chimenton     
page:      1015 - 1021
Auger Recombination-Enhanced Hot Carrier Degradation In Nmosfets With A Forward Substrate Bias (Article)
Subject: Auger Recombination
Author: C-W Tsai     
page:      1022 - 1026
Mosfet Gate Leakage Modeling And Delection Guide For Alternative Gate Dielectrics Based On Leakage Considerations (Article)
Subject: Direct Tunneling , Gate Leakage Current
Author: Yee-Chia Yeo     
page:      1027 - 1035
Impact Of Gate-Induced Drain Leakage On Retention Time Distribution Of 256 Mabit Dram With Negative Wordline Bias (Article)
Subject: Gate-Induced Drain Leakage
Author: Minchen Chang     
page:      1036 - 1041
Substrate-Triggered Technique For On-Chip Esd Protection Design In A 0.18-Um Salicided Cmos Process (Article)
Subject: Electrostatic Discharge
Author: Ming-Dou Ker     
page:      1050 - 1057
Nickel Induced Crystallization Of A-Si Gate Electrode At 500 C And Mos Capacitor Reliability (Article)
Subject: Capacitor Reliability
Author: Amol R Joshi     
page:      1058 - 1062
Shot-Noise Reduction In Multiple-Quantum-Well Resonant Tunneling Diodes (Article)
Subject: Multiple Quantum Wells
Author: Vincent Pouyet     
page:      1063 - 1068
Dc,Rf, Andmicrowave Noise Performance Of Algan-Gan Field Transistors Dependence Of Aluminum Concetration (Article)
Subject: Algan , Gan , Hemts
Author: Wu Lu     
page:      1069 - 1074
Capacitance Of Abrupt One-Sided Heterojunctions (Article)
Subject: Capacitance
Author: B Sheinman     
page:      1075 - 1080
Compact Distributed Rlc Interconnect Models-Part Iii: Transients In Dingle And Coupled Lines With Capacitive Load Termination (Article)
Subject: Bessel Functions , Crosstalk
Author: Raguraman Venkatesan     
page:      1081 - 1093
Compact Distributed Rlc Interconnect Models-Part Iv: Unified Models For Time Delay, Crosstalk,And Repeater Insertion (Article)
Subject: Crosstalk
Author: Raguraman Venkatesan     
page:      1094 - 1102
Mems Fingerprint Sensor Immune To Various Finger Surface Conditions (Article)
Subject: Fingerprint Image , Fingerprint Sensor
Author: Norio Sato     
page:      1109 - 1116
Gain Increases Through End Of Life In Traveling Wave Tubes (Article)
Subject: Gain Control
Author: Dan M Goebel     
page:      1117 - 1124
Characterization Of The Tunneling Insulator In Mim Cathodes By Low-Stress I-V Measurement (Article)
Subject: Cathodes , Current Measurement
Author: Mutsumi Suzuki     
page:      1125 - 1130
240-325-Ghz Gaas Cw Fundamental-Mode Tunnett Diodes Fabricated With Molecular Layer Epitaxy (Article)
Subject: Millimeter-Wave Devices
Author: Piotr Plltka     
page:      867 - 873
Dc Characterization Of An Inp-Ingaas Tunneling Emitter Bipolar Transistor (Tebt) (Article)
Subject: Ingap-Gaas , Offset Voltage
Author: Chun-Yuan Chen     
page:      874 - 879
Optimization Of Auge-Ni-Au Ohmic Contacts For Gaas Mosfets (Article)
Subject: Gaas Mosfet , Ohmic Contact
Author: Hung-Cheng Lin     
page:      880 - 885
Slow Trransients Observed In Algan/Gan Hfets: Effects Of Sin Passivation And Uv Iiiumination (Article)
Subject: Algan/Gan Hfets , Current Collapse
Author: Goutam Koley     
page:      886 - 893
Design And Performance Of Tunnel Collector Hbts For Microwave Power Amplifiers (Article)
Subject: Gaas/Gainp , Heterojunction Bipolar Transistors
Author: Rebecca J Welty     
page:      894 - 899
Field Dependence Of Impact Ionzation Coeffeicients In On0.53ga0.47as (Article)
Subject: Avalanche Breakdown , Avalanche Multiplication
Author: Js Ng     
page:      901 - 905
Sillcon Epitaxial Layer Recombination And Generation Lifetime Chara Characterization (Article)
Subject: Carrier Lifetimes , Epitaxial Layers
Author: D.K Schroder     
page:      906 - 912
Improve The Luminous Efficiency Of Ac Plasma Display By High-Frequency Driving On Address Electrodes (Article)
Subject: High Frequency , Luminous Efficacy
Author: Yi-Mei Li     
page:      913 - 917
Silicon Planar Technology For Single-Photon Optical Detectors (Article)
Subject: Photon Counting
Author: Emilio Sciacca     
page:      918 - 925
Static Characteristics Of A-Si:H Dual Gate Tfts (Article)
Subject: Amorphous Silicon
Author: Peyman Servati     
page:      926 - 932
Current Limited Stresses Of Sio2 Gate Oxides With Conductive Atomic Force Microscope (Article)
Subject: Atomic Force Microscopy
Author: Marc Porti     
page:      933 - 940
Elctrical Characteristics And Reliability Of Uv Transparent Si3 N4 Metal-Insulator-Metal (Mim Capacitors (Article)
Subject: Bi-Cmos , Capacitors
Author: Ronald Bolam     
page:      941 - 944
Novel Ultrahigh-Density Flash Memory With A Stacked-Surrounding Gate Transistor (S-Sgt)Structured Cekk (Article)
Subject: Flash Memory
Author: Tetsuo Endoh     
page:      945 - 951
Extension And Source Source/Drain Design For High- Perormance Finfet Devices (Article)
Subject: Transport , Double Gate
Author: Jakub Kedzierski     
page:      952 - 958
Modeling Of Parasitic Capacitancesin Deep Submicrometer Conventional And High-K Dielectric Mos Transistors (Article)
Subject: Fringing Field
Author: Nihar R Mohapatra     
page:      959 - 966
Localized Oxide Degradation In Ultrathin Gate Dielectric And Its Statistical Analysis (Article)
Subject: Gate Leakage Current
Author: Wei Yip Loh     
page:      967 - 972
A New Method To Characterize Border Traps In Submicron Transistors Using Hystersis In The Drain Current (Article)
Subject: Border Traps , Hysteresis
Author: K.N Manjularani     
page:      973 - 979
Optimal Global Interconnects For Gsi (Article)
Subject: Inductance , Interconnections
Author: Azad Naeemi     
page:      980 - 987
High-Performance Strained-Sol Cmos Devices Using Thin Film Sige-On-Insulator Technology (Article)
Subject: Cmos , Itox , Mobility
Author: Tomohisa Mizuno     
page:      988 - 994
Characterization Of Process-Induced Mobile Ions On The Data Retention In Flash Memory (Article)
Subject: Data Retention , Flash Memory
Author: Jimmy Jih-Wei Liou     
page:      995 - 1000